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Four point probe measuring instrument

Wayamba University of Sri Lanka

Product Category/ Test Name (Matrix):

Surface Analysis

Sub Category:

Any solid object


Service Charge (Rs) -

Manufacturer Jandel Funding Source AHEAD
Model RM 3000+ Whether the equipment service can be provided to external researchers/institutions No
Manufactured Year 0000 Availability of Technically Competent Staff
HS Code Instrument Condition Functioning well
Vendor Name Commencement of Operations Date
Vendor Contact InstrumentPrice 0.00
Vendor Url Stage of the Record Completed
Catalog Aceess
Catalog Upload View File
Catalog Link
Institute Wayamba University of Sri Lanka
Faculty Faculty of Technology
Department Department of Nano Science Technolog
Laboratory Nanotechnology research laboratory
Contact Person Name Head/ Department of Nanoscience Technology
Phone Number 0372284780
Mobile Number
Product Category Surface Analysis
Sub Category Any solid object
Testing Paremeters Partial Size, Elemental Composition
Description Use for the examination and analysis of micro- and nanoparticle imaging characterization of solid objects. Typically can magnify images around 300,000 times (up to 10 nm).
Relevant Instruments Scanning electron microscope (SEM)
Technical Specification
Number of samples per cycle 0
Number of samples per day 0
Total usage hour per day 0

Under Development Stage

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