||Crystal Structure, Material's Crystalline phases, Chemical Composition
||Crystal Structures, Lattice Parameters, Strain, Grain size, Phase Composition, Crystal defects
||X-ray diffraction (XRD) is a powerful non-destructive technique for characterizing crystalline materials. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays scattered at specific angles from each set of lattice planes in a sample. This technique is commonly used in many fields, including the Pharmaceutical industry, forensic science, geological science, ceramic and glass industry, etc. For example, in the ceramic industry, XRD is used to determine elemental composition analysis, the arrangements of those elements, defects, and quantity of elements and compounds.
||X-Ray Diffractometer (XRD)