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X-Ray Diffractometer

Sri Lanka Institute of Nanotechnology (SLINTEC)

Product Category/ Test Name (Matrix):

Crystallographic Analysis

Sub Category:

Crystal Structure, Material's Crystalline phases, Chemical Composition


Service Charge (Rs) -

Manufacturer Bruker Funding Source Ministry of Science
Model Bruker Axs D8 Focus Whether the equipment service can be provided to external researchers/institutions Yes
Manufactured Year 0000 Availability of Technically Competent Staff
HS Code Instrument Condition Not Functioning
Vendor Name Commencement of Operations Date
Vendor Contact InstrumentPrice 0.00
Vendor Url Stage of the Record Completed
Catalog Aceess
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Institute Sri Lanka Institute of Nanotechnology (SLINTEC)
Department Advanced Analytical Services
Laboratory Advanced Instruments Laboratory
Contact Person Name Ms. Wasana
Phone Number 0114650529
Mobile Number 0767604249
Product Category Crystallographic Analysis
Sub Category Crystal Structure, Material's Crystalline phases, Chemical Composition
Testing Paremeters Crystal Structures, Lattice Parameters, Strain, Grain size, Phase Composition, Crystal defects
Description X-ray diffraction (XRD) is a powerful non-destructive technique for characterizing crystalline materials. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays scattered at specific angles from each set of lattice planes in a sample. This technique is commonly used in many fields, including the Pharmaceutical industry, forensic science, geological science, ceramic and glass industry, etc. For example, in the ceramic industry, XRD is used to determine elemental composition analysis, the arrangements of those elements, defects, and quantity of elements and compounds.
Relevant Instruments X-Ray Diffractometer (XRD)
Technical Specification
Number of samples per cycle 0
Number of samples per day 0
Total usage hour per day 0

Under Development Stage

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